ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/17806368
Record Status Checked
Record Id 17806368
Title Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
Contributors
Abstract
Organisation ISIS , ISIS-VESUVIO , STFC , ISIS-CHIPIR
Keywords
Funding Information
Related Research Object(s):
Licence Information:
Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 11th International Symposium (ARC 2015), Bochum, Germany, 13-17 Apr 2015, Lecture Notes in Computer Science 9040 (2015): 331-338. doi:10.1007/978-3-319-16214-0_28 2015