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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/17806368
Record Status
Checked
Record Id
17806368
Title
Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
Contributors
LA Tambara
,
F Almeida
,
P Rech
,
FL Kastensmidt
,
G Bruni
,
C Frost (STFC Rutherford Appleton Lab.)
Abstract
Organisation
ISIS
,
ISIS-VESUVIO
,
STFC
,
ISIS-CHIPIR
Keywords
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Language
English (EN)
Type
Details
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Year
Paper In Conference Proceedings
In 11th International Symposium (ARC 2015), Bochum, Germany, 13-17 Apr 2015, Lecture Notes in Computer Science 9040 (2015): 331-338.
doi:10.1007/978-3-319-16214-0_28
2015
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