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Persistent URL	http://purl.org/net/epubs/work/26210
Record Status	Checked
Record Id	26210
Title	Characterization of PTFE on silicon wafer tribological transfer films by XPS, imaging XPS and AFM
Contributors	G Beamson (Daresbury), DT Clark (Daresbury), DE Deegan (Surrey U.), NW Hayes (Daresbury), D S L Law (Daresbury), JR Rasmusson (Linkoping U.), WR Salaneck (Linkoping U.)
Abstract
Organisation	CCLRC , SND
Keywords
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Preprint	DL Preprints DL-P-95-012 1995.			1995