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Persistent URL	http://purl.org/net/epubs/work/26260
Record Status	Checked
Record Id	26260
Title	Using synchrotron radiation x-ray multiple diffraction to examine the lattice coherency of semiconductor surfaces and epitaxial layers
Contributors	JM Sasaki (Campinas State U.), LP Cardoso (Campinas State U.), C Campos (Strathclyde U.), KJ Roberts, GF Clark (CCLRC Daresbury Lab.), E Pantos (CCLRC Daresbury Lab.), MA Sacilotti (Dijon U.)
Abstract
Organisation	CCLRC
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Preprint	DL Preprints DL-P-95-019 1995.			1995