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Persistent URL	http://purl.org/net/epubs/work/32477
Record Status	Checked
Record Id	32477
Title	In-situ x-ray topography studies during the molecular-beam epitaxy growth of Ingaas on (001) GaAs-effects of substrate dislocation distribution on strain relaxation.
Contributors	SJ Barnett, AM Keir, AG Cullis, AD Johnson, J Jefferson, GW Smith, T Martin, CR Whitehouse, G Lacey, GF Clark, BK Tanner, W Spirkl, B Lunn, JCH Hogg, P Ashu, WE Hagston, CM Castelli
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Organisation	CCLRC , SRS
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	J Phys D Appl Phys 28 (1995): 17-22.	doi:10.1088/0022-3727/28/4A/003		1995