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Persistent URL http://purl.org/net/epubs/work/32597
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Record Id 32597
Title X-ray scattering studies of semiconductor interfaces-atomic-structure and morphology.
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Organisation SRS , SERC
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Language English (EN)
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Journal Article Appl Surf Sci 41(2) (1989): 62-69. doi:10.1016/0169-4332(89)90034-2 1989