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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/32597
Record Status
Checked
Record Id
32597
Title
X-ray scattering studies of semiconductor interfaces-atomic-structure and morphology.
Contributors
E Vlieg
,
JF vanderVeen
Abstract
Organisation
SRS
,
SERC
Keywords
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Language
English (EN)
Type
Details
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Year
Journal Article
Appl Surf Sci
41(2) (1989): 62-69.
doi:10.1016/0169-4332(89)90034-2
1989
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