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Persistent URL	http://purl.org/net/epubs/work/36221754
Record Status	Checked
Record Id	36221754
Title	Photoexcited Muon Spin Spectroscopy: A New Method for Measuring Excess Carrier Lifetime in Bulk Silicon
Contributors	K Yokoyama (STFC Rutherford Appleton Lab., and Queen Mary's Univ., London), J Lord (STFC Rutherford Appleton Lab.), J Miao, P Murahari, A Drew (STFC Rutherford Appleton Lab., Queen Mary's Univ., London and Sichuan Univ., China)
Abstract
Organisation	ISIS , STFC
Keywords
Funding Information	IDEAS-ERC (307593)
Related Research Object(s):
Licence Information:
Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	Phys Rev Lett 119, no. 22 (2017): 226601.	doi:10.1103/PhysRevLett.119.226601		2017