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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/4211
Record Status
Checked
Record Id
4211
Title
Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection and atomic force microscopy
Contributors
D A Styrkas
,
J L Keddie
,
J R Lu
,
T J Su
,
P A Zhdan
Abstract
Organisation
CCLRC
,
ISIS
,
ISIS-CRISP
,
ISIS-SURF
Keywords
Chemistry
,
ISIS 2001
Funding Information
Related Research Object(s):
Licence Information:
Language
English (EN)
Type
Details
URI(s)
Local file(s)
Year
Journal Article
J Appl Phys
85 (1999): 1.
doi:10.1063/1.369205
1999
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