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Persistent URL	http://purl.org/net/epubs/work/48856901
Record Status	Checked
Record Id	48856901
Title	Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node
Contributors	L Xu, J Cao, J Brockman, C Cazzaniga (STFC Rutherford Appleton Lab.), C Frost (STFC Rutherford Appleton Lab.), S Wen, R Fung, BL Bhuva
Abstract
Organisation	ISIS , STFC , ISIS-CHIPIR
Keywords
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Paper In Conference Proceedings	In 2020 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA, 28 Apr 2020 - 30 May 2020, (2020): 1-5.	doi:10.1109/IRPS45951.2020.9128360		2020