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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/48856955
Record Status
Checked
Record Id
48856955
Title
Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET
Contributors
K Niskanen
,
AD Touboul
,
RC Germanicus
,
A Michez
,
A Javanainen
,
F Wrobel
,
J Boch
,
V Pouget
,
F Saigne
Abstract
Organisation
ISIS
,
STFC
,
ISIS-CHIPIR
Keywords
Funding Information
H2020
(721624)
Related Research Object(s):
Licence Information:
Language
English (EN)
Type
Details
URI(s)
Local file(s)
Year
Journal Article
IEEE Trans Nucl Sci
67, no. 7 (2020): 1365-1373.
doi:10.1109/TNS.2020.2983599
2020
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