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Persistent URL	http://purl.org/net/epubs/work/50300
Record Status	Checked
Record Id	50300
Title	An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
Contributors	X Lai (Institute of Particle Science and Engineering, School of Process, Environmental and Materials Engineering, The University of Leeds, Leeds LS2 9JT), CY Ma (Institute of Particle Science and Engineering, School of Process, Environmental and Materials Engineering, The University of Leeds, Leeds LS2 9JT), KJ Roberts (Institute of Particle Science and Engineering, School of Process, Environmental and Materials Engineering, The University of Leeds, Leeds LS2 9JT), LP Cardoso (IFGW, UNICAMP, CP 6165, 13083-970 Campinas, SP, Brazil), AO Dos Santos (IFGW, UNICAMP, CP 6165, 13083-970 Campinas, SP, Brazil), D Bogg (STFC Daresbury Lab.), MC Miller (STFC Daresbury Lab.)
Abstract	Diffraction imaging using x-ray topography XRTand x-ray multiple diffraction XRMD provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry microcrystallography. The topographic x-ray multiple diffraction microprobe TMDM combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very stable in vacuum and electron beam environments. The design of the TMDM instrument is described together with data taken on GaAs 001 and potassium dihydrogen phosphate 001.
Organisation	CSE , TECH , STFC
Keywords	instrumentation diffraction topography , Materials
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	Rev Sci Instrum 80 (2009): 033705.	doi:10.1063/1.3103571		2009