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Record Id 51290
Title Defect characterization and analysis of III-V nanowires grown by Ni-promoted MBE
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Language English (EN)
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Journal Article Phys Status Solidi A 205, no. 11 (2008): 2589-2592. Presented at: 3rd International Conference on micro-Nanoelectronics, nanotechnology and MEMs, Athens, greece, 18-21 Nov 2007. doi:10.1002/pssa.200780132 2008