ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/59437
Record Status Checked
Record Id 59437
Title The observation of oxidation-induced stacking-faults and extrinsic gettering in silicon using x-ray-diffraction topography
Contributors
Abstract
Organisation SRS , SERC
Keywords
Funding Information
Related Research Object(s):
Licence Information:
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Philos Mag 65 (4) (1992): 783-795. 1992