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Persistent URL	http://purl.org/net/epubs/work/30768723
Record Status	Checked
Record Id	30768723
Title	Muon-induced soft errors in 16-nm NAND flash memories
Contributors	M Bagatin, S Gerardin, A Paccagnella, A Visconti, S Beltrami, M Bertuccio, K Ishida, CD Frost (STFC Rutherford Appleton Lab.), A Hillier (STFC Rutherford Appleton Lab.), V Ferlet-Cavrois
Abstract
Organisation	ISIS , ISIS-RIKEN , ISIS-MUONS , STFC , ISIS-CHRONUS
Keywords
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Paper In Conference Proceedings	In 2016 IEEE International Reliability Physics Symposium (IRPS 2016), Pasadena, California, USA, 17-21 May 2016, (2016): 5C-1-1-5C-1-5.	doi:10.1109/IRPS.2016.7574552		2016