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Persistent URL	http://purl.org/net/epubs/work/49866801
Record Status	Checked
Record Id	49866801
Title	Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements
Contributors	K Yokoyama (STFC Rutherford Appleton Lab.), JS Lord (STFC Rutherford Appleton Lab.), J Miao, P Murahari, AJ Drew
Abstract
Organisation	ISIS , STFC
Keywords
Funding Information	ERC, FP7 Ideas (307593); STFC (RB1720505)
Related Research Object(s):
Licence Information:
Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	Appl Phys Lett 118, no. 25 (2021): 252105.	doi:10.1063/5.0054291		2021