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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/50771
Record Status
Checked
Record Id
50771
Title
High energy X-ray diffraction as a method of strain analysis
Contributors
SY Zhang (STFC Rutherford Appleton Lab.)
,
AM Korsunsky (Oxford U.)
Abstract
Strain analysis in engineering components and assemblies is important for the purposes of evaluating deformation response to in service or laboratory loading, so as to characterise the presence of flaws or damage, and also of residual stresses that affect engineering performance. Synchrotron radiation provides brightest (most parallel and high intensity) X-ray beams over a wide rage of energies. Higher energy X-rays are particularly well-suited for the analysis of internal strains within bulk (poly)crystalline materials, because of their excellent penetration depths exceeding ten(s) of millimetres in most structural alloys. Experimental modes (monochromatic and energy-dispersive) will be reviewed, and information obtainable from diffraction patterns (inter-granular and macro-strains, texture) will be illustrated. The connection between diffraction analysis of internal strains and fatigue durability will be pointed out.
Organisation
ISIS
,
ISIS-ENGIN-X
,
STFC
Keywords
Engineering
,
residual stress
,
diffraction
,
High energy X-ray
,
strain
Funding Information
Related Research Object(s):
Licence Information:
Language
English (EN)
Type
Details
URI(s)
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Year
Paper In Conference Proceedings
In 5th International Conference on Condition Monitoring and Machinery Failure Prevention Technology, 2008, (2008).
CM2008.pdf
2008
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