ePubs
The open archive for STFC research publications
Home
About ePubs
Content Policies
News
Help
Privacy/Cookies
Suggest an Enhancement
Contact ePubs
Full Record Details
Persistent URL
http://purl.org/net/epubs/work/63135
Record Status
Checked
Record Id
63135
Title
Neutron-Induced Upsets in NAND Floating Gate Memories
Contributors
S Gerardin
,
M Bagatin
,
A Ferrario
,
A Paccagnella
,
A Visconti
,
S Beltrami
,
C Andreani
,
G Gorini
,
CD Frost (STFC Rutherford Appleton Lab.)
Abstract
Organisation
ISIS
,
ISIS-VESUVIO
,
STFC
,
ISIS-CHIPIR
Keywords
ISIS 2013
Funding Information
Related Research Object(s):
Licence Information:
Language
English (EN)
Type
Details
URI(s)
Local file(s)
Year
Journal Article
IEEE Transactions on Device and Materials Reliability 12, no. 2 (2012): 437-444.
doi:10.1109/TDMR.2012.2192440
2012
Showing record 1 of 1
Recent Additions
Browse Organisations
Browse Journals/Series
Login to add & manage publications and access information for OA publishing
Username:
Password:
Useful Links
Chadwick & RAL Libraries
SHERPA FACT
SHERPA RoMEO
SHERPA JULIET
Journal Checker Tool
Google Scholar